QuickSun® 130XE – minimodule tester for R&D
High-performance mini-module flash tester for laboratories and quality control
Module components, such as silver paste, ribbons, and coatings need to be tested in a PV module to determine their influence in real-world conditions. The use of small modules for these tests adds convenience and space savings for laboratories. Some changes to module components might have only a small effect on overall power output, so accurate test results are key in observing the small changes.
QuickSun 130XE is a compact mini-module flasher for testing of small PV modules. The Class A+A+A+ solar simulator can be equipped with a high resolution EL inspection as a single table top system.
- I-V measurement and EL inspection within seconds with minimal module handling
- The most cost-effective solution for small modules with state-of-the-art inspection tools
- Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
- Module sizes up to 32 cm by 42 cm
- HJT, bifacial, frameless… You can test them all
- Minimal footprint of 64 cm x 70 cm x 135 cm
QuickSun 130XE achieves A+A+A+ classification. Irradiance non-uniformity of < 1% is maintained over the test area of 42 cm by 32 cm. The spectrum produced by the Xenon flash extends from 300 to 1200nm, fully compatible with the new IEC 60904-9 Ed.3. The spectral coverage of the spectrum is 100% making sure variation in PV module materials does not go unnoticed.
Long-term instability (LTI) is typically < 0.5 % during the 60 ms long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method. This scientifically justified procedure enables the measurement of the steady-state I-V curve in only 60 ms, eliminating the need for longer flash pulses. The applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9.
High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator. Automatic defect analysis can be used to detect faults in the mini-modules.
|Module dimensions||Maximum 42 cm x 32 cm||Other dimensions on request|
|Measurement time||< 5 seconds||Typical, including I-V measurement and EL inspection|
|Cycle time||10 seconds|
|Contacting||Manual contacting to module cables||Other options available on request|
|Total dimensions, weight||64 cm (W) x 70 cm (D) x 150 cm (H)||80 kg|
|Operation temperature||15 – 35 °C|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A+, < ± 1%|
|Spectrum||Class A+, < ± 12,5%|
|Long-term instability (LTI)||Class A+, < ± 1%|
|Lamp changeover interval||750 000 measurements (average)|
|Bifacial measurement||Single-side or both sides separately||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance range||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||18 MP / 100 µm per pixel||Higher resolutions on request|
|Measurement time||1 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 20 A||Freely adjustable|
|Automatic defect detection||Available on request|