QuickSun® 130XL

QuickSun® 130XL – minimodule tester for R&D

High-performance mini-module flash tester for laboratories and quality control

Module components, such as silver paste, ribbons, and coatings need to be tested in a PV module to determine their influence in real-world conditions. The use of small modules for these tests adds convenience and space savings for laboratories. Some changes to module components might have only a small effect on overall power output, so accurate test results are key in observing the small changes.

QuickSun 130XL is a compact mini-module flasher for testing of small PV modules. The Class A+A+A+ solar simulator can be equipped with a high resolution EL inspection as a single table top system.

  • I-V measurement and EL inspection within seconds with minimal module handling
  • The most cost-effective solution for small modules with state-of-the-art inspection tools
  • Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
  • Module sizes up to 32 cm by 42 cm
  • HJT, bifacial, frameless… You can test them all
  • Minimal footprint of 64 cm x 70 cm x 135 cm

Solar simulation

QuickSun 130XL achieves A+A+A+ classification. Irradiance non-uniformity of < 1% is maintained over the test area of 42 cm by 32 cm. The spectrum produced by the Xenon flash extends from 300 to 1200nm, fully compatible with the new IEC 60904-9 Ed.3. The spectral coverage of the spectrum is 100% making sure variation in PV module materials does not go unnoticed.

Long-term instability (LTI) is typically < 0.5 % during the 60 ms long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method. This scientifically justified procedure enables the measurement of the steady-state I-V curve in only 60 ms, eliminating the need for longer flash pulses. The applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9.

ELectroluminescence

High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator. Automatic defect analysis can be used to detect faults in the mini-modules.

Key characteristics

General

Module dimensionsMaximum 42 cm x 32 cmOther dimensions on request
Measurement time< 5 secondsTypical, including I-V measurement and EL inspection
Cycle time10 seconds
ContactingManual contacting to module cablesOther options available on request
Total dimensions, weight64 cm (W) x 70 cm (D) x 150 cm (H)80 kg
Operation temperature15 – 35 °C

Solar simulator

Pmp repeatabilityStandard deviation < 0.1 %
Irradiance non-uniformityClass A+, < ± 1%
SpectrumClass A+, < ± 1%
Long-term instability (LTI)Class A+, < ± 1%
Lamp changeover interval750 000 measurements (average)
Bifacial measurementSingle-side or both sides separatelyAcc. IEC TS 60904-1-2:2019
High-capacitance modulesCapacitive effects eliminated with the Capacitance Compensation (CAC) methodAcc. IEC 60904-1:2020,
IEC TS 60904-14:2020
Irradiance range200 – 1200 W/m²Resolution 1 W/m²
Voltage measurement1 – 100 V (other scales on request)Accuracy better than ±0.2 %
Current measurement0.5 – 25 A (other scales on request)Accuracy better than ±0.2 %
Voltage sweepIsc -> Voc, Voc -> IscCapacitance Compensation (CAC) method

EL inspection

Image resolution18 MP / 100 µm per pixelHigher resolutions on request
Measurement time1 – 5 seconds Typical, depends on cell type
Current range0 – 20 A Freely adjustable
Automatic defect detectionAvailable on request