QuickSun 540XLi – versatility flasher for largest BIPV modules
solar simulator for very large modules – bipv
Building integrated PV modules can be very large to cover the outer surfaces of buildings. QuickSun 540XLi can accommodate modules up to 360 cm by 210 cm in a compact system. The basic setup includes a top-class solar simulator that measures modules in the sunny-side up position. Additional measurement methods can be integrated into the same system, such as high-resolution EL inspection. With the easy-to-operate system and our expert support, even entrants into the photovoltaics manufacturing business can easily adopt the best quality control practices established in the industry.
Thanks to an innovative Xenon lamp system, the overall dimensions of the system are kept compact. Compared to a full-length flash tunnel, which can be up to 10 meters long, the overall dimensions are only 4.3 x 3.6 x 3.3 meters. Thanks to the open structure of the system, BIPV elements can be freely transported under the system for easy handling.
Our unique lamp system allows the test area to customized exactly to your specifications. Larger test areas increase system width and length according to the maximum module size, but height will not increase.
- I-V measurement and EL inspection within seconds with minimal module handling
- The most cost-effective solution for state-of-the-art inspection tools
- Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
- By far the most compact solution for I-V and EL on the market
- HJT, bifacial, frameless, custom dimensions… You can test them all
- Compatible with module sizes up to 1.4 x 2.7 m²
- System can be customized to any module size.
With the A+A+A+ classification, continuous 300–1200 nm Xenon spectrum and Pmax repeatability of less than 0.1%, the measurements are highly reliable. High-efficiency PV technologies, such as HJT and TOPCon, are accurately measured with the trusted Capacitance Compensation (CAC) method which was published at the 35th EU PVSEC 2018 conference and has swiftly started to be adopted by the industry.
High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator.
The system can be equipped with capabilities for temperature coefficient, Hipot, ground bond and bypass diode measurements. Further customization is available on request.
|Module dimensions||Maximum 360 cm x 210 cm||Cam be customized to any size|
|Measurement time||< 5 seconds||Typical, including I-V measurement and EL inspection|
|Cycle time||10 seconds|
|Contacting||Manual contacting to module cables||Other options available on request|
|Total dimensions, weight||430 cm (W) x 360 cm (D) x 330 cm (H)||900 kg|
|Operation temperature||15 – 35 °C|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A+, < ± 1%|
|Spectrum||Class A+, < ± 1%|
|Long-term instability (LTI)||Class A+, < ± 1%|
|Lamp changeover interval||750 000 measurements (average)|
|Bifacial measurement||Single-side or both sides separately||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance range||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||65 MP / 350 µm per pixel||Higher resolutions on request|
|Measurement time||1 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 20 A||Freely adjustable|
|Automatic defect detection||Available on request|
|Temperature coefficient measurement||From room temperature to RT + 15 °C|
|Hipot test||Up to 6.5 kV||0.1 nA sensitivity|
|Ground continuity||55 mA test current|
|Bypass diode test||IEC 61215-2 Functionality test|