Endeas All-in-One takes module testing further
Optimizing the total cost of ownership is one of the most essential keys to improved production efficiency in PV module manufacturing. The All-in-One concept developed…
The QuickSun 650 is a fully automated and highly productive PV module testing station. Thanks to the ability to handle up to 150 modules per hour, QuickSun 650 is an ideal solution for mass production of solar panels.
QuickSun® 650 has been designed according to the Endeas all-in-one concept, enabling smooth operations and minimum use of space. As separate flasher, EL, optical inspection or Hipot testers are not needed, a lot less space and operating resources are required. Less equipment efficiently translates into higher production line uptime.
As the All-in-One concept reduces the need for floor space, it opens up new possibilities for line upgrades. In addition, shorter production line can be ramped up faster, including the training of operators and engineers.
QuickSun® 650 has outstanding measurement stability with Pmax repeatability smaller than 0.1 %. Combining superior productivity with durability and low maintenance costs, QuickSun® 650 is able to provide an exceptionally low cost of ownership as a complete tool for PV module testing.
QuickSun 650 achieves A+A+A+ classification. Irradiance non-uniformity of < 1% is maintained over the test area of 270 cm by 140 cm. The spectrum produced by the Xenon flash extends from 300 to 1200 nm, fully compatible with the new standard IEC 60904-9 Ed.3. The spectral coverage of the spectrum is 100% making sure variation in PV module materials does not go unnoticed.
Long-term instability (LTI) is typically < 0.5 % during the 60 ms long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method. This scientifically justified procedure enables the measurement of the steady-state I-V curve in only 60 ms, eliminating the need for longer flash pulses. The QuickSun 650 testing chamber is inherently designed to enable the single-side testing of bifacial modules at elevated intensities. The applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9.
EL images with 200-μm pixel resolution are recorded with three 20MP cameras, enabling software-based automatic image analysis to identify and categorize small faults, such as micro-cracks and finger interruptions. Bypass diodes are tested according to the functionality test specified in the standard IEC 61215-2, and a high-resolution image of the cell side of the module is recorded and used to analyse such features as cell-to-cell distance, particle contamination, and ribbon misalignment.
QuickSun 600 has the capability to perform hipot and ground continuity testing. The actual leakage current is measured with a sensitive enough instrument that enables a run-time diagnosis of both contacting reliability and real module leakage characteristics. A 100% coverage of electrical safety testing for UL certification is achieved.
|Module transport direction||Long-side-leading|
|Module dimensions||Maximum 140 cm x 260 cm||Easily adjustable to smaller sizes|
|Cycle time||25 seconds|
|Contacting||Fully automatic direct to JB||Automatic to contact adapter|
|Total dimensions, weight||460 cm (W) x 200 cm (D) x 240 cm (H)||1900 kg|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A+, < ± 1%|
|Spectrum||Class A+, < ± 12,5%|
|Long-term instability (LTI)||Class A+, < ± 1%|
|Flash tube lifetime||750 000 measurements (average)|
|Bifacial measurement||Single-side||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance control||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||100 MP / 200 µm per pixel||Higher resolutions on request|
|Measurement time||1 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 20 A||Freely adjustable|
|Automatic defect detection||Available on request|
|Optical inspection||135 MP||Optical inspection|
|Hipot test||Up to 6.5 kV||0.1 nA sensitivity|
|Ground continuity||55 mA test current|
|Bypass diode test||IEC 61215-2 Functionality test|
|Temperature coefficient measurement||From room temperature to RT + 15 °C|