QuickSun® 650lab – versatility and productivity to Pv laboratories
Improved precision and reliability, meeting the strictest industry standards
QuickSun 650Lab establishes a completely new product class for PV module laboratories – Class A+A+A+ solar simulator and high resolution EL inspection as a single system. The size of the system is comparable to the most compact solar simulators or EL inspection tools on the market – with the exception that QuickSun 650Lab includes them both! Just place the module in and connect the cables, and the system provides both the I-V characteristics and EL image within seconds – ready for automatic reporting or further analysis.
- I-V measurement and EL inspection within seconds with minimal module handling
- The most cost-effective solution for state-of-the-art inspection tools
- Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
- By far the most compact solution for I-V and EL on the market
- HJT, bifacial, frameless, custom dimensions… You can test them all
- Compatible with module sizes up to 1.4 x 2.7 m²
QuickSun 650Lab achieves A+A+A+ classification. Irradiance non-uniformity of < 1% is maintained over the test area of 270 cm by 140 cm. The spectrum produced by the Xenon flash extends from 300 to 1200 nm, fully compatible with the new standard IEC 60904-9 Ed.3. The spectral coverage of the spectrum is 100% making sure spectral response variation between of PV modules causes minimal uncertainty.
Long-term instability (LTI) is typically < 0.5 % during the 60 ms long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method. This scientifically justified procedure enables the measurement of the steady-state I-V curve in only 60 ms, eliminating the need for longer flash pulses.
The QuickSun 650 testing chamber is inherently designed to enable the single-side testing of bifacial modules at elevated intensities. The applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9. With Pmax repeatability of less than 0.1%, QuickSun 650Lab is an essential tool for laboratories.
High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator. Automatic analysis software can be used to find defects in the PV modules.
The system can be equipped with capabilities for temperature coefficient, Hipot, ground continuity and bypass diode measurements. Further customization is available on request.
|Module dimensions||Maximum 140 cm x 270 cm||Quickly adjustable to smaller sizes|
|Measurement time||< 5 seconds||Typical, including I-V measurement and EL inspection|
|Cycle time||10 seconds|
|Contacting||Manual contacting to module cables||Other options available on request|
|Total dimensions, weight||420 cm (W) x 200 cm (D) x 200 cm (H)||700 kg|
|Operation temperature||15 – 35 °C|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A+, < ± 1%|
|Spectrum||Class A+, < ± 12,5%|
|Long-term instability (LTI)||Class A+, < ± 1%|
|Lamp changeover interval||750 000 measurements (average)|
|Bifacial measurement||Single-side or both sides separately||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance range||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||100 MP / 200 µm per pixel||Higher resolutions on request|
|Measurement time||1 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 20 A||Freely adjustable|
|Automatic defect detection||Available as an option|
|Temperature coefficient measurement||From room temperature to RT + 15 °C|
|Hipot test||Up to 6.5 kV||0.1 nA sensitivity|
|Ground continuity||55 mA test current|
|Bypass diode test||IEC 61215-2 Functionality test|