versatile module testing
Economic tunnel or tower simulator for manufacturing, laboratory, and mobile applications
QuickSun 800-Series solar simulators offer a value packed solution to PV module testing. Class AAA solar simulator and high resolution EL inspection can be integrated as a single horizontal tunnel or vertical tower system. Just place the module in and connect the cables, and the system provides both the I-V characteristics and EL image within seconds – ready for automatic reporting or further analysis.
Depending on your application, the smallest QuickSun 810A can measure modules up to 0.8 x 1.3 m² while saving space with the most compact tunnel/tower. QuickSun 820A can measure modules up to 1.15 x 2.1 m², and QuickSun 830A up to 1.4 x 2.3 m².
- I-V measurement and EL inspection within seconds with minimal module handling
- The most cost-effective solution for standard PV module testing
- Class AAA solar simulator with continuous 300–1200 nm Xenon spectrum
- PERC, bifacial, frameless, custom dimensions… You can test them all
- Compatible with module sizes up to 1.4 x 2.3 m²
- Options: Electrical safety measurement, bypass diode test
With the AAA classification, continuous 300–1200 nm Xenon spectrum and Pmax repeatability of less than 0.1%, the measurements are highly reliable. High-efficiency PV technologies, such as nPERT and nPERC, are reliably measured with the trusted Capacitance Compensation (CAC) method which was published at the 35th EU PVSEC 2018 conference and has swiftly started to be adopted by the industry.
High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator.
The system can be equipped with capabilities for temperature coefficient, Hipot, and bypass diode measurements. Further customization is available on request.
|QuickSun 820A||QuickSun 830A|
|Module dimensions||115 cm x 210 cm||140 cm x 230 cm|
|Measurement time||< 5 seconds||< 5 seconds||Typical, including I-V measurement and EL inspection|
|Cycle time||30 seconds||30 seconds|
|Contacting||Manual contacting to module cables||Other options available on request|
|Total dimensions, weight||465 cm x 240 cm x 250 cm||555 cm x 250 cm x 270 cm||Other options available on request|
|Operation temperature||15 – 35 °C|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A, < ± 2%|
|Spectrum||Class A, < ± 25%|
|Long-term instability (LTI)||Class A, < ± 2%|
|Flash tube lifetime||200 000 measurements (average)|
|Bifacial measurement||Single-side or both sides separately||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance control||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||20 MP / 400 µm per pixel||Higher resolutions on request|
|Measurement time||1 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 20 A||Freely adjustable|
|Automatic defect detection||Available on request|
|Temperature coefficient measurement||From room temperature to RT + 15 °C|
|Hipot test||Up to 6.5 kV||0.1 nA sensitivity|
|Ground continuity||55 mA test current|
|Bypass diode test||IEC 61215-2 Functionality test|