Customizable flash tester for BIPV & VIPV modules
solar simulator for very large modules – bipv & VIPV
Building integrated PV and vehicle integrated PV modules can be very large or untraditional in shape. QuickSun 550Ei can be customized to cover very large test area and to measure curved photovoltaic modules based on your specifications. The basic setup includes a top-class solar simulator to measure modules in the sunny-side up position. Additional measurement methods can be integrated into the same system, such as high-resolution EL inspection. With this easy-to-operate system and our expert support, even entrants into the photovoltaics manufacturing business can easily adopt the best quality control practices established in the industry.
Thanks to an innovative Endeas Xenon technology and open structure of the QuickSun 550Ei, the overall dimensions of the system are kept compact and large and complex PV elements can be freely transported and easily handled under the system.
- I-V measurement and EL inspection within seconds with minimal module handling
- The most cost-effective solution for state-of-the-art inspection tools
- Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
- By far the most compact solution for I-V and EL on the market
- System can be customized to any module size.
With the A+A+A+ classification, continuous 300–1200 nm Xenon spectrum and Pmax repeatability of less than 0.1%, the measurements are highly reliable. High-efficiency PV technologies, such as HJT and TOPCon, are accurately measured with the trusted Capacitance Compensation (CAC) method.
High-quality EL image aquisiton within seconds with a static camera setup. The EL image is captured after I-V measurement without any additional work required from the operator.
The system can be equipped with capabilities for temperature coefficient, Hipot, ground bond and bypass diode measurements. Further customization is available on request.
|Module dimensions||Can be customized to any size|
|Measurement time||< 5 seconds||Typical, including I-V measurement and EL inspection|
|Cycle time||10 seconds|
|Contacting||Manual contacting to module cables||Other options available on request|
|Total dimensions, weight||Based on specification|
|Operation temperature||15 – 35 °C|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A+, < ± 1%|
|Spectrum||Class A+, < ± 12,5%|
|Long-term instability (LTI)||Class A+, < ± 1%|
|Lamp changeover interval||750 000 measurements (average)|
|Bifacial measurement||Single-side or both sides separately||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance range||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||Multiple options available|
|Measurement time||1 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 20 A||Freely adjustable|
|Automatic defect detection||Available on request|
|Temperature coefficient measurement||From room temperature to RT + 15 °C|
|Hipot test||Up to 6.5 kV||0.1 nA sensitivity|
|Ground continuity||55 mA test current|
|Bypass diode test||IEC 61215-2 Functionality test|