QuickSun® 650Lab

QuickSun® 650lab – versatility and productivity to Pv laboratories

Improved precision and reliability, meeting the strictest industry standards

QuickSun 650Lab establishes a completely new product class for PV module laboratories – Class A+A+A+ solar simulator and high resolution EL inspection as a single system. The size of the system is comparable to the most compact solar simulators or EL inspection tools on the market – with the exception that QuickSun 650Lab includes them both! Just place the module in and connect the cables, and the system provides both the I-V characteristics and EL image within seconds – ready for automatic reporting or further analysis.

  • I-V measurement and EL inspection within seconds with minimal module handling
  • The most cost-effective solution for state-of-the-art inspection tools
  • Class A+A+A+ solar simulator with continuous 300–1200 nm Xenon spectrum
  • By far the most compact solution for I-V and EL on the market
  • HJT, bifacial, frameless, custom dimensions… You can test them all
  • Compatible with module sizes up to 1.4 x 2.7 m²

Solar simulation

QuickSun 650Lab achieves A+A+A+ classification. Irradiance non-uniformity of < 1% is maintained over the test area of 270 cm by 140 cm. The spectrum produced by the Xenon flash extends from 300 to 1200 nm, fully compatible with the new standard IEC 60904-9 Ed.3. The spectral coverage of the spectrum is 100% making sure spectral response variation between of PV modules causes minimal uncertainty.

Long-term instability (LTI) is typically < 0.5 % during the 60 ms long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method. This scientifically justified procedure enables the measurement of the steady-state I-V curve in only 60 ms, eliminating the need for longer flash pulses.

The QuickSun 650 testing chamber is inherently designed to enable the single-side testing of bifacial modules at elevated intensities. The applied test procedures and reports comply fully with the standards IEC 60904-1 and IEC 60904-9. With Pmax repeatability of less than 0.1%, QuickSun 650Lab is an essential tool for laboratories.


High-quality EL images are acquired within seconds by a static camera setup. The EL image is captured after I-V measurement without any additional work required by the operator. Automatic analysis software can be used to find defects in the PV modules.

optional features

The system can be equipped with capabilities for temperature coefficient, Hipot, ground continuity and bypass diode measurements. Further customization is available on request.

Key characteristics


Module dimensionsMaximum 140 cm x 270 cmQuickly adjustable to smaller sizes
Measurement time< 5 secondsTypical, including I-V measurement and EL inspection
Cycle time10 seconds
ContactingManual contacting to module cablesOther options available on request
Total dimensions, weight420 cm (W) x 200 cm (D) x 200 cm (H)700 kg
Operation temperature15 – 35 °C

Solar simulator

Pmp repeatabilityStandard deviation < 0.1 %
Irradiance non-uniformityClass A+, < ± 1%
SpectrumClass A+, < ± 12,5%
Long-term instability (LTI)Class A+, < ± 1%
Lamp changeover interval750 000 measurements (average)
Bifacial measurementSingle-side or both sides separatelyAcc. IEC TS 60904-1-2:2019
High-capacitance modulesCapacitive effects eliminated with the Capacitance Compensation (CAC) methodAcc. IEC 60904-1:2020,
IEC TS 60904-14:2020
Irradiance range200 – 1200 W/m²Resolution 1 W/m²
Voltage measurement1 – 100 V (other scales on request)Accuracy better than ±0.2 %
Current measurement0.5 – 25 A (other scales on request)Accuracy better than ±0.2 %
Voltage sweepIsc -> Voc, Voc -> IscCapacitance Compensation (CAC) method

EL inspection

Image resolution100 MP / 200 µm per pixelHigher resolutions on request
Measurement time1 – 5 secondsTypical, depends on cell type
Current range0 – 20 AFreely adjustable
Automatic defect detectionAvailable as an option


Temperature coefficient measurementFrom room temperature to RT + 15 °C
Hipot testUp to 6.5 kV0.1 nA sensitivity
Ground continuity55 mA test current
Bypass diode testIEC 61215-2 Functionality test