PV module Testing for laboratories
High capacity and precise PV module testing
The QuickSun 600Lab is a class A+A+A+ solar simulator for laboratories and manual PV module inspection. Thanks to the sophisticated IV measurement instrumentation and ease-of-use, QuickSun 600 is a go-to tool for R&D and quality assurance.
The device is compatible with Endeas All-in-One technology. This means that besides I-V testing, the system performs EL imaging, bypass diode test and electrical safety testing. All tests in a single machine increases testing process efficiency by eliminating unnecessary module handling.
- Class A+A+A+ solar simulator
- All-in-One testing to enhance testing laboratory testing process
- Accurate results for the high efficiency modules
- Modules sizes up to 265 cm x 137 cm
The QuickSun 600Lab solar simulators attain A+A+A+ classification per IEC 60904-9 Ed.3. Exceptional measurement stability ensures power measurement repeatability below 0.1%, offering optimal value for manufactured modules and high-quality data for product development and Industry 4.0 process control. Even high-efficiency HJT, TOPCon, IBC, and similar modules are accurately measured using optimized flash pulse length and our proprietary Capacitance Compensation (CAC) method.
EL imaging and Bypass Diode Test
Easily achieve exceptional EL images with our seamlessly integrated camera setup. Our system automatically captures images immediately after I-V measurement, simplifying the process and removing the need for additional machines or tasks for the operator. Enjoy enhanced efficiency and precision for a seamless workflow experience.
QuickSun 600Lab has the capability to perform hipot and ground continuity testing. The actual leakage current is measured with a sensitive enough instrument that enables a run-time diagnosis of both contacting reliability and real module leakage characteristics.
|LEL or SEL
|Maximum 137 cm x 265 cm
|Easily adjustable to smaller sizes
|With All-in-One testing
|Manual to module cables
|Standard deviation < 0.1 %
|IEC 90604-9 Ed.3
|Flash tube lifetime
|750 000 measurements (average)
|High eff. modules
|Capacitance Compensation (CAC) method
|HJT, TOPCon, IBC etc.
|1–100 V & 0.5-25 A (other scales on request)
|Accuracy < ±0.2 %
|Isc -> Voc, Voc -> Isc
|During single flash
|250 µm per pixel
|Deep learning analysis on request
|Bypass diode test
|Acc. IEC 61215-2
|Electrical safety tests
|Hipot & Ground continuity
|Real values measured
|Available on request