High capacity PV module testing
High capacity and precise PV module testing
The QuickSun 650 is a fully automated and highly productive PV module testing station. Thanks to the ability to handle up to 150 modules per hour, QuickSun 650 is an ideal solution for mass production of solar panels.
QuickSun® 650 is compatible with Endeas All-in-One concept. This means I-V test, EL imaging, optical inspection, bypass diode test, and electrical safety tests are integrated into single machine. Less machines needed translates into saved floor space and higher production uptime.
As the All-in-One concept reduces the need for floor space, it opens up new possibilities for line upgrades. In addition, shorter production line can be ramped up faster, including the training of operators and engineers.
QuickSun® 650 has outstanding measurement stability with Pmax repeatability smaller than 0.1 %. Combining superior productivity with durability and low maintenance costs, QuickSun® 650 is able to provide an exceptionally low cost of ownership as a complete tool for PV module testing.
- A+A+A+ solar simulator, EL, Hipot, ground continuity, optical inspection, and bypass diode tests
- Reliable results for the high efficiency modules
- Maximized productivity: 150 modules per hour, all above tests included
- Fully automated PV module handling
- Minimized factory footprint of 11 m²
- Low total cost of ownership
- Compatible with modules sizes up to 2700mm x 1400mm
QuickSun 650 achieves A+A+A+ classification. Irradiance non-uniformity of < 1% is maintained over the test area. The spectrum produced by the Xenon flash extends from 300 to 1200 nm, fully compatible with the new standard IEC 60904-9 Ed.3. The spectral coverage of the spectrum is 100% making sure variation in PV module materials does not go unnoticed.
Long-term instability (LTI) is < 0.5 % during the 60 ms long flash pulse. Even the high efficiency modules are measured accurately with Capacitance Compensation (CAC) method. The PV module testing station is designed to enable the single-side testing of bifacial modules at elevated intensities. The applied tests and reports comply fully with the standards IEC 60904-1 and IEC 60904-9.
EL, Optical Inspection, and Bypass Diode Tests
A high resolution EL images enable software-based automatic image analysis to identify and categorize small faults, such as micro-cracks and finger interruptions. Bypass diodes are tested according to the functionality test specified in the standard IEC 61215-2. A high resolution image of the cell side of the module is recorded and used to analyse such features as cell-to-cell distance, particle contamination, and ribbon misalignment.
Electrical Safety in pv module testing
QuickSun 650 has the capability to perform hipot and ground continuity testing. The actual leakage current is measured with a sensitive enough instrument that enables a run-time diagnosis of both contacting reliability and real module leakage characteristics. A 100% coverage of electrical safety testing for UL certification is achieved.
|Module transport direction||Long-side-leading|
|Module dimensions||Maximum 140 cm x 270 cm||Easily adjustable to smaller sizes|
|Cycle time||24 seconds|
|Contacting||Fully automatic direct to JB||Automatic to contact adapter|
|Total dimensions, weight||460 cm (W) x 200 cm (D) x 240 cm (H)||1900 kg|
|Pmp repeatability||Standard deviation < 0.1 %|
|Irradiance non-uniformity||Class A+, < ± 1%|
|Spectrum||Class A+, < ± 12,5%|
|Long-term instability (LTI)||Class A+, < ± 1%|
|Flash tube lifetime||750 000 measurements (average)|
|Bifacial measurement||Single-side||Acc. IEC TS 60904-1-2:2019|
|High-capacitance modules||Capacitive effects eliminated with the Capacitance Compensation (CAC) method||Acc. IEC 60904-1:2020,|
IEC TS 60904-14:2020
|Irradiance control||200 – 1200 W/m²||Resolution 1 W/m²|
|Voltage measurement||1 – 100 V (other scales on request)||Accuracy better than ±0.2 %|
|Current measurement||0.5 – 25 A (other scales on request)||Accuracy better than ±0.2 %|
|Voltage sweep||Isc -> Voc, Voc -> Isc||Capacitance Compensation (CAC) method|
|Image resolution||100 MP / 200 µm per pixel||Higher resolutions on request|
|Measurement time||0.3 – 5 seconds||Typical, depends on cell type|
|Current range||0 – 40 A||Freely adjustable|
|Automatic defect detection||Available on request|
|Optical inspection||135 MP||Optical inspection|
|Hipot test||Up to 6.5 kV||0.1 nA sensitivity|
|Ground continuity||55 mA test current|
|Bypass diode test||IEC 61215-2 Functionality test|
|Temperature coefficient measurement||From room temperature to RT + 15 °C|